ET4277 Microelectronics reliability
Topics: Reliability issues involved in electronic components and system
This course aims to provide the students with a thorough understanding of the reliability issues involved in electronic components and systems. The following subjects will be treated.
- Basic reliability definition and lifetime distributions.
- Reliability prediction methods.
- Physical failure mechanisms in electronic components
- Package related failures
- Reliability screening and reliability testing
- Failure analysis methods
- Reliability data handling
- Design considerations
- System reliability
Teachers
prof.dr.ir. Willem van Driel (ECTM)
Microelectronics and microsystems technologies, virtual prototyping, virtual reliability qualification, designing for reliability of microelectronics and microsystems, physics of failure.
prof.dr. GuoQi Zhang (ECTM)
Heterogenous system integration, 2D materials and devices, wide bandgap semiconductor sensors, digital twin and reliability, multi-scale and multi-physics modeling
Last modified: 2025-09-25
Details
| Credits: | 4 EC |
|---|---|
| Period: | 0/0/3/0 |
| Contact: | Willem van Driel |